se@rit events

Wei Le Ph.D.

Office:
1557 Golisano Hall

Office Phone:
585-475-4070

Preferred E-Mail:
wei.le@rit.edu

Web Site

My primary research interests include program analysis, software security and software testing. My research seeks automatic, practical solutions in the areas of software engineering, security and programming languages for improving software reliability and security.

Wei Le is an assistant professor at the PhD program in Computing and Information Sciences at the Rochester Institute of Technology. Wei received her Ph.D. in Computer Science from the University of Virginia in December 2010. Her research focuses on developing automatic, practical solutions for improving software reliability and security, covering the areas of program analysis, software testing and software security. Wei received the best presentation award at the 16th ACM SIGSOFT International Symposium on the Foundation of Software Engineering and also is a recipient of a Google Anita Borg Memorial Scholarship.

[ISSTA11] Wei Le and Mary Lou Soffa, Generating Analyses for Detecting Faults in Path Segments, International Symposium on Software Testing and Analysis, 2011.

[SESENA11] Wei Le, Jing Yang, Mary Lou Soffa and Kamin Whitehouse, Lazy Preemption to Enable Path-Based Analysis of Interrupt-Driven Code, 2nd International Workshop on Software Engineering for Sensor Network Applications, 2011.

[FSE10] Wei Le and Mary Lou Soffa, Path-Based Fault Correlation,18th ACM SIGSOFT International Symposium on the Foundation of Software Engineering, 2010, Page(s): 307-316.

[FSE08] Wei Le and Mary Lou Soffa, Marple, A Demand-Driven Path-Sensitive Buffer Overflow Detector,16th ACM SIGSOFT International Symposium on the Foundation of Software Engineering, 2008, Page(s): 272-282.

[PASTE07] Wei Le and Mary Lou Soffa, Refining Buffer Overflow Detection via Demand-Driven Path-Sensitive Analysis, 7th Workshop on Program Analysis for Software Tools and Engineering, 2007, Page(s): 63-68.

[TSE05] David Coppit, Jinlin Yang, Sarfraz Khurshid, Wei Le and Kevin Sullivan, Software Assurance by Bounded Exhaustive Testing, IEEE Transactions on Software Engineering, Volume 31, Issue 4, April 2005, Page(s):328-339.